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Semplor Expands Its Tabletop SEM Portfolio with ONYX and NANOS EBSD

Semplor Expands Its Tabletop SEM Portfolio with ONYX and NANOS EBSD Semplor has announced two major additions to its tabletop electron microscopy portfolio: the new ONYX large-stage SEM and the NANOS EBSD platform, bringing advanced crystallographic and elemental analysis to tabletop microscopy.
Project
  • Muhammed
  • 2026-09-07

Semplor Expands Its Tabletop SEM Portfolio with ONYX and NANOS EBSD 

Semplor has announced two major additions to its tabletop electron microscopy portfolio: the new ONYX large-stage SEM and the NANOS EBSD platform, bringing advanced crystallographic and elemental analysis to tabletop microscopy. 

ONYX – Large-Stage Tabletop SEM 

The newly launched ONYX extends the capabilities of tabletop SEM to larger and higher-throughput samples. Featuring a 220 × 220 mm sample chamber and 110 × 110 mm motorized XY travel, Semplor positions ONYX as having the largest stage in the tabletop SEM market. 

With <8 nm resolution, SE and 4-quadrant BSE detection, integrated EDS, and both high- and low-vacuum operation, ONYX combines advanced imaging and elemental analysis with the accessibility of a compact tabletop system. 

NANOS EBSD – SEM, EDS and EBSD in One Compact Platform 

Semplor has also expanded the NANOS platform with integrated EBSD (Electron Backscatter Diffraction) capability. 

Combining SEM imaging, EDS elemental analysis and EBSD crystallographic characterization in a single tabletop platform enables users to investigate surface morphology, elemental composition, crystal orientation, phases and grain structure. 

The system integrates the Bruker e-Flash XS EBSD detector, with acquisition speeds of up to 520 frames per second, together with a dedicated 70° eucentric tilt designed for efficient EBSD analysis. 

Advancing Tabletop Electron Microscopy 

With ONYX addressing larger samples and higher sample capacity, and NANOS EBSD bringing advanced crystallographic characterization to the tabletop format, Semplor continues to expand the possibilities of compact electron microscopy for materials science, metallurgy, geology, industrial quality control, failure analysis, research and education. 

Both solutions are now available for technical consultation, demonstration and quotation.